IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Approach for Two-Sided Matching with Interval-Valued Preference under Regret Theory

2015 7th International Conference on Intelligent Human-Machine Systems and Cybernetics (IHMSC)

Author(s): Lin Yang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Hangzhou, China
Conference Date: 26 August 2015
Volume: 1
Page(s): 53 - 56
ISBN (Electronic): 978-1-4799-8646-0
ISBN (Paper): 978-1-4799-8645-3
DOI: 10.1109/IHMSC.2015.77
Regular:

This paper investigates the problem of two-sided matching (TSM) of interval-valued preference within the framework of Regret theory. Firstly, interval-value preferences given by agents are... View More

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