IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation of plasmon-induced losses in quasi-ballistic transport

Author(s): P. Lugli ; D.K. Ferry
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1985
Volume: 6
Page(s): 25 - 27
ISSN (Paper): 0741-3106
ISSN (Online): 1558-0563
DOI: 10.1109/EDL.1985.26030
Regular:

We present an ensemble Monte Carlo (EMC) simulation of the effect of electron-electron (e-e) and electron-plasmon (e-pl) interactions on the transient behavior of electrons under high energy... View More

Advertisement