IEEE - Institute of Electrical and Electronics Engineers, Inc. - FMNet: Physical Trait Patterns in the Fashion World

2015 Second European Network Intelligence Conference (ENIC)

Author(s): Alexandru Topirceanu ; Mihai Udrescu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2015
Conference Location: Karlskrona, Sweden
Conference Date: 21 September 2015
Page(s): 25 - 32
ISBN (Electronic): 978-1-4673-7592-4
ISBN (USB): 978-1-4673-7591-7
DOI: 10.1109/ENIC.2015.12
Regular:

In light of a constantly growing interest and real-world applicability shown in social collaboration networks, we have gathered data from Fashion Model Directory, the largest fashion model... View More

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