IEEE - Institute of Electrical and Electronics Engineers, Inc. - Innovative data treatment routines for atomic force microscopy force curves

2015 International Conference on Advances in Biomedical Engineering (ICABME)

Author(s): Rami Klaimi ; Karim El Kirat
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2015
Conference Location: Beirut, Lebanon
Conference Date: 16 September 2015
Page(s): 234 - 237
ISBN (Electronic): 978-1-4673-6516-1
ISBN (USB): 978-1-4673-6515-4
ISSN (Electronic): 2377-5696
DOI: 10.1109/ICABME.2015.7323295
Regular:

The atomic force microscopy (AFM) is an important innovation in the sample imaging fields, the signals extracted from the AFM such as the force as function of the indentation and the friction as... View More

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