IEEE - Institute of Electrical and Electronics Engineers, Inc. - Inherent characteristics of traceability artifacts less is more

2015 IEEE 23rd International Requirements Engineering Conference (RE)

Author(s): Jane Huffman Hayes ; Giulio Antoniol ; Bram Adams ; Yann-Gael Gueheneuc
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Ottawa, ON, Canada
Conference Date: 24 August 2015
Page(s): 196 - 201
ISBN (Electronic): 978-1-4673-6905-3
ISBN (USB): 978-1-4673-6904-6
DOI: 10.1109/RE.2015.7320422
Regular:

This paper describes ongoing work to characterize the inherent ease or "traceability" with which a textual artifact can be traced using an automated technique. Software traceability approaches use... View More

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