IEEE - Institute of Electrical and Electronics Engineers, Inc. - RRAM Reliability/Performance Characterization through Array Architectures Investigations

2015 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)

Author(s): Cristian Zambelli ; Alessandro Grossi ; Piero Olivo ; Christian Walczyk ; Christian Wenger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Montpellier, France
Conference Date: 8 July 2015
Page(s): 327 - 332
ISBN (CD): 978-1-4799-8718-4
ISBN (Electronic): 978-1-4799-8719-1
DOI: 10.1109/ISVLSI.2015.17
Regular:

The reliability and performance characterization of each non-volatile memory technology requires the thorough investigation of dedicated array test structures that mimic the real operations of a... View More

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