IEEE - Institute of Electrical and Electronics Engineers, Inc. - VecMeter: Measuring Vectorization on the Xeon Phi

2015 IEEE International Conference on Cluster Computing (CLUSTER)

Author(s): Joshua Peraza ; Ananta Tiwari ; William A. Ward ; Roy Campbell ; Laura Carrington
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2015
Conference Location: Chicago, IL, USA
Conference Date: 8 September 2015
Page(s): 478 - 481
ISBN (Electronic): 978-1-4673-6598-7
DOI: 10.1109/CLUSTER.2015.73
Regular:

Wide vector units in Intel's Xeon Phi accelerator cards can significantly boost application performance when used effectively. However, there is a lack of performance tools that provide... View More

Advertisement