IEEE - Institute of Electrical and Electronics Engineers, Inc. - A configurable board-level adaptive incremental diagnosis technique based on decision trees

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

Author(s): Cristiana Bolchini ; Luca Cassano
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Amherst, MA, USA
Conference Date: 12 October 2015
Page(s): 227 - 232
ISBN (Electronic): 978-1-4799-8606-4
ISBN (USB): 978-1-5090-0312-9
DOI: 10.1109/DFT.2015.7315167
Regular:

Functional diagnosis for complex electronic boards is a time-consuming task that requires big expertise to the diagnosis engineers. In this paper we propose a new engine for board-level adaptive... View More

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