IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving X-tolerant combinational output compaction via input rotation

2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

Author(s): Asad Amin Bawa ; Nur A. Touba
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2015
Conference Location: Amherst, MA, USA
Conference Date: 12 October 2015
Page(s): 167 - 170
ISBN (Electronic): 978-1-4799-8606-4
ISBN (USB): 978-1-5090-0312-9
DOI: 10.1109/DFT.2015.7315156
Regular:

Combinational linear compactors can be used to compact the output response for a large number of scan chains into a smaller number of outputs. While some compactor designs can guarantee... View More

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