IEEE - Institute of Electrical and Electronics Engineers, Inc. - EO data for rapid risk analysis with the RASOR platform

2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)

Author(s): Fifame N. Koudogbo ; Roberto Rudari ; Andrew Eddy ; Eva Trasforini ; Lauro Rossi ; Herve Yesou ; Joost Beckers ; Fabio Dell'acqua ; Martin Huber ; Achim Roth ; Stefano Salvi ; Athanassios Ganas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Milan, Italy
Conference Date: 26 July 2015
Page(s): 4,817 - 4,820
ISBN (Electronic): 978-1-4799-7929-5
ISBN (USB): 978-1-4799-7928-8
DOI: 10.1109/IGARSS.2015.7326908
Regular:

Climate change challenges our understanding of risk by modifying hazards and their interactions. Sudden increases in population and rapid urbanization are changing exposure to risk around the... View More

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