IEEE - Institute of Electrical and Electronics Engineers, Inc. - Estimation of sunflower yield using multi-spectral satellite data (optical or radar) in a simplified agro-meteorological model

2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)

Author(s): Remy Fieuzal ; Frederic Baup
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Milan, Italy
Conference Date: 26 July 2015
Page(s): 4,001 - 4,004
ISBN (Electronic): 978-1-4799-7929-5
ISBN (USB): 978-1-4799-7928-8
DOI: 10.1109/IGARSS.2015.7326702
Regular:

This paper aims to compare the crop yield retrieval performances, obtained by assimilating the leaf area index derived from multi-temporal satellite signatures (i.e. reflectances and... View More

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