IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sensitivity of X-band SAR data to crop status: PEA and carrot cases

2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)

Author(s): Luigi Dini ; Rocchina Guarini ; Francesco Vuolo ; Claudia Notarnicola
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Milan, Italy
Conference Date: 26 July 2015
Page(s): 3,981 - 3,984
ISBN (Electronic): 978-1-4799-7929-5
ISBN (USB): 978-1-4799-7928-8
DOI: 10.1109/IGARSS.2015.7326697
Regular:

This study aims at presenting the results of a correlation analysis between the COSMO-SkyMed X-band backscattering coefficients (σ0) at VV and VH polarization and the DEIMOS-based... View More

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