IEEE - Institute of Electrical and Electronics Engineers, Inc. - A hierarchical patch clustering method for high-resolution TerraSAR-X images

2015 IEEE International Geoscience and Remote Sensing Symposium (IGARSS)

Author(s): Wei Yao ; Otmar Loffeld ; Mihai Datcu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Milan, Italy
Conference Date: 26 July 2015
Page(s): 2,370 - 2,373
ISBN (Electronic): 978-1-4799-7929-5
ISBN (USB): 978-1-4799-7928-8
DOI: 10.1109/IGARSS.2015.7326285
Regular:

In this paper, we present a Gaussian test-based hierarchical clustering method for high-resolution TerraSAR-X images. The purpose is to obtain homogeneous clusters. k-means is used to split image... View More

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