IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving Intelligent Vehicle Dependability by Means of Infrastructure-Induced Tests

2015 45th IEEE International Conference on Dependable Systems and Networks Workshops (DSN-W)

Author(s): Wilfried Steiner ; Ayhan Mehmed ; Sasikumar Punnekkat
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Rio de Janeiro, Brazil
Conference Date: 22 June 2015
Page(s): 147 - 152
ISBN (Electronic): 978-1-4673-8044-7
ISSN (Electronic): 2325-6664
DOI: 10.1109/DSN-W.2015.14
Regular:

Advanced driver assistance systems (ADAS) take over more and more driving responsibilities from the human operator and, therefore, evolve into safety-critical systems. Thus, the dependability of... View More

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