IEEE - Institute of Electrical and Electronics Engineers, Inc. - Use of multiple model change detection for crack detection in Euler-Bernoulli beam

2015 20th International Conference on Methods and Models in Automation and Robotics (MMAR)

Author(s): Marek Feher ; Miroslav Simandl ; Ivo Puncochar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Miedzyzdroje, Poland
Conference Date: 24 August 2015
Page(s): 163 - 168
ISBN (CD): 978-1-4799-8700-9
ISBN (Electronic): 978-1-4799-8701-6
DOI: 10.1109/MMAR.2015.7283865
Regular:

This paper deals with a possibility of applying multiple model change detection for crack detection in a beam. The beam is considered here to be a single-span uniform Euler-Bernoulli beam with... View More

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