IEEE - Institute of Electrical and Electronics Engineers, Inc. - Low-frequency noise of advanced memory devices

2015 International Conference on Noise and Fluctuations (ICNF)

Author(s): E. Simoen ; R. Ritzenthaler ; T. Schram ; N. Horiguchi ; M. Jurczak ; A. Thean ; C. Claeys ; M. Aoulaiche ; A. Spessot ; P. Fazan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Xian, China
Conference Date: 2 June 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4673-8335-6
ISBN (USB): 978-1-4673-8334-9
DOI: 10.1109/ICNF.2015.7288633
Regular:

This paper reviews the application of low-frequency noise and Random Telegraph Signal (RTS) studies on advanced memory devices, namely, Metal-Insulator-Metal capacitors with SrTiOx as... View More

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