IEEE - Institute of Electrical and Electronics Engineers, Inc. - Variability of low frequency noise in moderately-sized MOSFETs — A model for the area- and gate voltage-dependence

2015 International Conference on Noise and Fluctuations (ICNF)

Author(s): Nikolaos Mavredakis ; Predrag Habas ; Alexandre Acovic ; Rene Meyer ; Matthias Bucher
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Xian, China
Conference Date: 2 June 2015
Page(s): 1 - 4
ISBN (Electronic): 978-1-4673-8335-6
ISBN (USB): 978-1-4673-8334-9
DOI: 10.1109/ICNF.2015.7288578
Regular:

In this paper, a thorough statistical investigation of low frequency noise (LFN) variability in MOSFETs is presented. In smaller-sized devices, noise fluctuations are area-dominated. In moderate-... View More

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