IEEE - Institute of Electrical and Electronics Engineers, Inc. - Inspecting surface mounted devices using k nearest neighbor and Multilayer Perceptron

2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)

Author(s): Alexandre R. de Mello ; Marcelo R. Stemmer
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Buzios, Brazil
Conference Date: 3 June 2015
Page(s): 950 - 955
ISBN (Electronic): 978-1-4673-7554-2
ISBN (USB): 978-1-4673-7553-5
ISSN (Electronic): 2163-5145
DOI: 10.1109/ISIE.2015.7281599
Regular:

Automatic inspection of electronic components during the production of printed circuit boards is a way to ensure the quality of this production, reducing the cost of re-work. An automatic optical... View More

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