IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated PCB inspection in small series production based on SIFT algorithm

2015 IEEE 24th International Symposium on Industrial Electronics (ISIE)

Author(s): Charbel Szymanski ; Marcelo Ricardo Stemmer
Sponsor(s): IEEE
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Buzios, Brazil
Conference Date: 3 June 2015
Page(s): 594 - 599
ISBN (Electronic): 978-1-4673-7554-2
ISBN (USB): 978-1-4673-7553-5
ISSN (Electronic): 2163-5145
DOI: 10.1109/ISIE.2015.7281535
Regular:

There has long been a concern to improve the techniques of image processing for PCB's inspection. However, it is noticed the focus is mainly on the inspection of PCB in mass production. Even with... View More

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