IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fault-Localization Approach Based on the Coincidental Correctness Probability

2015 IEEE International Conference on Software Quality, Reliability and Security (QRS)

Author(s): Xiaoli Zhou ; Hanfei Wang ; Jianhua Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Vancouver, BC, Canada
Conference Date: 3 August 2015
Page(s): 292 - 297
ISBN (CD): 978-1-4673-7988-5
ISBN (Electronic): 978-1-4673-7989-2
DOI: 10.1109/QRS.2015.48
Regular:

Coverage-based fault localization is a spectrum-based technique that identifies the executing program elements that correlate with failure. However, the effectiveness of coverage-based fault... View More

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