IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparing and Evaluating CVSS Base Metrics and Microsoft Rating System

2015 IEEE International Conference on Software Quality, Reliability and Security (QRS)

Author(s): Awad A. Younis ; Yashwant K. Malaiya
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Vancouver, BC, Canada
Conference Date: 3 August 2015
Page(s): 252 - 261
ISBN (CD): 978-1-4673-7988-5
ISBN (Electronic): 978-1-4673-7989-2
DOI: 10.1109/QRS.2015.44
Regular:

Evaluating the accuracy of vulnerability security risk metrics is important because incorrectly assessing a vulnerability to be more critical could lead to a waste of limited resources available... View More

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