IEEE - Institute of Electrical and Electronics Engineers, Inc. - Abstracting Program Dependencies Using the Method Dependence Graph

2015 IEEE International Conference on Software Quality, Reliability and Security (QRS)

Author(s): Haipeng Cai ; Raul Santelices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Vancouver, BC, Canada
Conference Date: 3 August 2015
Page(s): 49 - 58
ISBN (CD): 978-1-4673-7988-5
ISBN (Electronic): 978-1-4673-7989-2
DOI: 10.1109/QRS.2015.18
Regular:

While empowering a wide range of software engineering tasks, the traditional fine-grained software dependence (TSD) model can face great scalability challenges that hinder its applications. Many... View More

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