IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep Learning for Just-in-Time Defect Prediction

2015 IEEE International Conference on Software Quality, Reliability and Security (QRS)

Author(s): Xinli Yang ; David Lo ; Xin Xia ; Yun Zhang ; Jianling Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Vancouver, BC, Canada
Conference Date: 3 August 2015
Page(s): 17 - 26
ISBN (CD): 978-1-4673-7988-5
ISBN (Electronic): 978-1-4673-7989-2
DOI: 10.1109/QRS.2015.14
Regular:

Defect prediction is a very meaningful topic, particularly at change-level. Change-level defect prediction, which is also referred as just-in-time defect prediction, could not only ensure software... View More

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