IEEE - Institute of Electrical and Electronics Engineers, Inc. - A hybrid optimization algorithm for pairwise test suite generation

2015 IEEE International Conference on Information and Automation (ICIA)

Author(s): Rongzhi Qi ; Zhijian Wang ; Ping Ping ; Shuiyan Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Lijiang, China
Conference Date: 8 August 2015
Page(s): 3,062 - 3,067
ISBN (Electronic): 978-1-4673-9104-7
ISBN (USB): 978-1-4673-9103-0
DOI: 10.1109/ICInfA.2015.7279814
Regular:

Pairwise testing is an effective combinatorial test generation technique that can generate relative small test suite to cover all pairs of parameter values at least once. Genetic algorithm has... View More

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