IEEE - Institute of Electrical and Electronics Engineers, Inc. - An improved algorithm for triangle to triangle intersection test

2015 IEEE International Conference on Information and Automation (ICIA)

Author(s): Xiufen Ye ; Le Huang ; Lin Wang ; Huiming Xing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Lijiang, China
Conference Date: 8 August 2015
Page(s): 2,689 - 2,694
ISBN (Electronic): 978-1-4673-9104-7
ISBN (USB): 978-1-4673-9103-0
DOI: 10.1109/ICInfA.2015.7279740
Regular:

The triangle-to-triangle intersection test is a basic component of all collision detection data structures and algorithms. There are many algorithms that have been put forward in this area... View More

Advertisement