IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Method of Obtaining Modal Sensitivity for Damage Location in Beam Structure

2015 Seventh International Conference on Measuring Technology and Mechatronics Automation (ICMTMA)

Author(s): Zhu Kang ; Lei Liping ; Zeng Pan
Sponsor(s): Hunan Inst. Ind.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Nanchang, China
Conference Date: 13 June 2015
Page(s): 31 - 34
ISBN (CD): 978-1-4673-7142-1
ISBN (Electronic): 978-1-4673-7143-8
DOI: 10.1109/ICMTMA.2015.16
Regular:

In beam structure, damage detection is important to the safety during its usage. The non-destructive method (NDM) based on based on variation of natural frequencies of structure are powerful and... View More

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