IEEE - Institute of Electrical and Electronics Engineers, Inc. - Short answer question examination using an automatic off-line handwriting recognition system and a novel combined feature

2015 International Joint Conference on Neural Networks (IJCNN)

Author(s): Hemmaphan Suwanwiwat ; Michael Blumenstein ; Umapada Pal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Killarney, Ireland
Conference Date: 12 July 2015
Page(s): 1 - 8
ISBN (Electronic): 978-1-4799-1960-4
ISBN (DVD): 978-1-4799-1959-8
ISSN (Electronic): 2161-4407
DOI: 10.1109/IJCNN.2015.7280538
Regular:

Off-line automatic assessment systems can be an aid for teachers in the marking process. There has been no recent work in the development of off-line automatic assessment systems using handwriting... View More

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