IEEE - Institute of Electrical and Electronics Engineers, Inc. - Semi-supervised Min-Max Modular SVM

2015 International Joint Conference on Neural Networks (IJCNN)

Author(s): Yan-Ping Wu ; Yun Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Killarney, Ireland
Conference Date: 12 July 2015
Page(s): 1 - 8
ISBN (Electronic): 978-1-4799-1960-4
ISBN (DVD): 978-1-4799-1959-8
ISSN (Electronic): 2161-4407
DOI: 10.1109/IJCNN.2015.7280505
Regular:

Min-Max Modular Support Vector Machine (M3-SVM) is a powerful supervised ensemble pattern classification method, and it can efficiently deal with large scale labeled data. However, it is very... View More

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