IEEE - Institute of Electrical and Electronics Engineers, Inc. - Image reconstruction via statistical classification for magnetic induction tomography
2015 International Joint Conference on Neural Networks (IJCNN)
Author(s): | Yuyan Xue ; Min Han |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 July 2015 |
Conference Location: | Killarney, Ireland |
Conference Date: | 12 July 2015 |
Page(s): | 1 - 7 |
ISBN (Electronic): | 978-1-4799-1960-4 |
ISBN (DVD): | 978-1-4799-1959-8 |
ISSN (Electronic): | 2161-4407 |
DOI: | 10.1109/IJCNN.2015.7280365 |
Regular:
Magnetic induction tomography (MIT) is a non-invasive technology for visualization of the conductivity distribution inside inhomogeneous media. So far, the resolution of MIT has not been high... View More