IEEE - Institute of Electrical and Electronics Engineers, Inc. - Expected similarity estimation for large scale anomaly detection

2015 International Joint Conference on Neural Networks (IJCNN)

Author(s): Markus Schneider ; Wolfgang Ertel ; Gunther Palm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Killarney, Ireland
Conference Date: 12 July 2015
Page(s): 1 - 8
ISBN (Electronic): 978-1-4799-1960-4
ISBN (DVD): 978-1-4799-1959-8
ISSN (Electronic): 2161-4407
DOI: 10.1109/IJCNN.2015.7280331
Regular:

We propose a new algorithm named EXPected Similarity Estimation (EXPoSE) to approach the problem of anomaly detection (also known as one-class learning or outlier detection) which is based on the... View More

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