IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental analysis and modelling of coaxial transmission lines with soft shield defects

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): H. Manesh ; J. Genoulaz ; A. Kameni ; F. Loete ; L. Pichon ; O. Picon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 1,553 - 1,558
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256406
Regular:

Significant research has focused on the diagnosis of "hard" faults (open and short circuits) in transmission lines, but there has been much less work on "soft" faults resulting from a very small... View More

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