IEEE - Institute of Electrical and Electronics Engineers, Inc. - Verification of novel extended mixed-mode S-parameters on three-conductor lines

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): Nan Zhang ; Wansoo Nah
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 1,319 - 1,322
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256362
Regular:

The novel extended mixed-mode S-parameters of the three-conductor lines are proposed in this paper based on the mode analysis. The extended mixed-mode S-parameters do not contain the cross-mode... View More

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