IEEE - Institute of Electrical and Electronics Engineers, Inc. - Passive device degradation models for an electromagnetic emission robustness study of a buck DC-DC converter

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): He Huang ; Alexandre Boyer ; Sonia Ben Dhia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 1,304 - 1,309
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256359
Regular:

Past works showed that the degradation of the electronic devices caused by aging could induce failures of electronic system, including a harmful evolution of electromagnetic compatibility. This... View More

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