IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the validity and statistical significance of HEMP test standards

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): Lars Ole Fichte ; Sven Knoth ; Stefan Potthast ; Frank Sabath ; Marcus Stiemer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 865 - 870
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256278
Regular:

Critical electronic devices, i.e. units whose operation is essential, must be able to work even when exposed to extreme electromagnetic signals, such as High Altitude Nuclear Electromagnetic... View More

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