IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical properties of low frequency voltages induced by a plane-wave field across the terminal loads of a random wire-bundle

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): Giordano Spadacini ; Flavia Grassi ; Sergio A. Pignari
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 824 - 829
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256270
Regular:

This work deals with disturbances induced by a plane-wave field in a random bundle of wires running above ground. Particularly, after a general presentation of the geometrical model of the random... View More

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