IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of electromagnetic analytical models for substrate noise propagation in integrated circuits
2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)
Author(s): | Merce Grau Novellas ; Ramiro Serra ; Matthias Rose |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 August 2015 |
Conference Location: | Dresden, Germany |
Conference Date: | 16 August 2015 |
Page(s): | 582 - 587 |
ISBN (CD): | 978-1-4799-6615-8 |
ISBN (Electronic): | 978-1-4799-6616-5 |
ISSN (Electronic): | 2158-1118 |
DOI: | 10.1109/ISEMC.2015.7256228 |
Regular:
In this paper, electromagnetic analytical models for substrate noise propagation are developed for its use in electromagnetic compatibility performance prediction for integrated circuits. The... View More