IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of electromagnetic analytical models for substrate noise propagation in integrated circuits

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): Merce Grau Novellas ; Ramiro Serra ; Matthias Rose
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 582 - 587
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256228
Regular:

In this paper, electromagnetic analytical models for substrate noise propagation are developed for its use in electromagnetic compatibility performance prediction for integrated circuits. The... View More

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