IEEE - Institute of Electrical and Electronics Engineers, Inc. - Tested once, forever right? Influence of aging and temperature on susceptibility and emissions

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): Kai Borgeest
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 271 - 276
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256171
Regular:

EMC tests are usually done with electronic systems from production under comfortable environmental conditions. The scope of the paper is to analyze how aging and variable environment conditions,... View More

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