IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detection method for overclocking by intentional electromagnetic interference

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): Atsushi Nagao ; Yuichiro Okugawa ; Kazhiro Takaya ; Yu-ichi Hayashi ; Naofumi Homma ; Takafumi Aoki
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 241 - 245
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256166
Regular:

Overclocking due to the disruption of a clock signal sometimes causes malfunctions (i.e., temporal faults) in LSI modules. It is known that electromagnetic interference can also cause... View More

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