IEEE - Institute of Electrical and Electronics Engineers, Inc. - Advanced fault analysis techniques on AES

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): Kazuo Sakiyama ; Takanori Machida ; Arisa Matsubara
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 230 - 234
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256164
Regular:

Fault analysis research on symmetric-key cipher has been intensively discussed since differential fault analysis (DFA) was proposed in 1997. Output masking for wrong ciphertexts was believed to be... View More

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