IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modelling the micro-structure of non-uniform conductive non-woven fabrics: Determination of sheet resistance

2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

Author(s): A. N. Austin ; J. F. Dawson ; I. D. Flintoft ; A. C. Marvin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2015
Conference Location: Dresden, Germany
Conference Date: 16 August 2015
Page(s): 1 - 6
ISBN (CD): 978-1-4799-6615-8
ISBN (Electronic): 978-1-4799-6616-5
ISSN (Electronic): 2158-1118
DOI: 10.1109/ISEMC.2015.7256122
Regular:

The plane-wave shielding effectiveness of conductive non-woven fabrics is dominated by the sheet conductance over a wide range of frequencies until the effects of skin depth, and apertures start... View More

Advertisement