IEEE - Institute of Electrical and Electronics Engineers, Inc. - Empirical support for the high-density subset sum decision threshold

2015 IEEE 14th Canadian Workshop on Information Theory (CWIT)

Author(s): T. E. O'Neil ; T. Desell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: St. John's, NL, Canada
Conference Date: 6 July 2015
Page(s): 160 - 164
ISBN (Electronic): 978-1-4799-6560-1
ISBN (USB): 978-1-4799-6559-5
DOI: 10.1109/CWIT.2015.7255176
Regular:

This article describes several properties of the random problem space for the Subset Sum problem, derived both empirically and analytically. Empirical results support the conjecture that Subset... View More

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