IEEE - Institute of Electrical and Electronics Engineers, Inc. - A rapid mapping approach to quantify damages caused by the 2003 bam earthquake using high resolution multitemporal optical images

2015 8th International Workshop on the Analysis of Multitemporal Remote Sensing Images (Multi-Temp)

Author(s): Daniela Faur ; Mihai Datcu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Annecy, France
Conference Date: 22 July 2015
Page(s): 1 - 4
ISBN (Electronic): 978-1-4673-7119-3
ISBN (USB): 978-1-4673-7118-6
DOI: 10.1109/Multi-Temp.2015.7245752
Regular:

This paper aims to reveal a methodology used to quantitatively evaluate the impact of an earthquake on a region, considering multi temporal high resolution optical images. The proposed approach... View More

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