IEEE - Institute of Electrical and Electronics Engineers, Inc. - Further investigation of statistical parameters of nanocomposite multi-tip emitters

2015 28th International Vacuum Nanoelectronics Conference (IVNC)

Author(s): A. G. Kolosko ; E. O. Popov ; S. V. Filippov ; P. A. Romanov ; E. I. Terukov
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2015
Conference Location: Guangzhou, China
Conference Date: 13 July 2015
Page(s): 40 - 41
ISBN (Electronic): 978-1-4673-9357-7
ISBN (Paper): 978-1-4673-9356-0
DOI: 10.1109/IVNC.2015.7225523
Regular:

The advanced technique of current-voltage characteristic (IVC) on-line processing and recording was developed. It allows to observe and evaluate statistical dependences of the emission centers for... View More

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