IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast algorithm to minimize model combining dynamically local and global fitting energy for image segmentation

2015 3rd International Conference on Control, Engineering & Information Technology (CEIT)

Author(s): Yamina Boutiche
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2015
Conference Location: Tlemcen, Algeria
Conference Date: 25 May 2015
Page(s): 1 - 6
ISBN (Electronic): 978-1-4799-8212-7
ISBN (USB): 978-1-4799-8211-0
DOI: 10.1109/CEIT.2015.7232985
Regular:

Segmentation by using region-based deformable models has known a great success and large domain of applications. In this paper, we propose a fast algorithm to minimise model which combines local... View More

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