IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detecting Corporate Social Media Crises on Facebook Using Social Set Analysis

2015 IEEE International Congress on Big Data (BigData Congress)

Author(s): Raghava Rao Mukkamala ; Jannie Iskou Sorensen ; Abid Hussain ; Ravi Vatrapu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: New York, NY, USA
Conference Date: 27 June 2015
Page(s): 745 - 748
ISBN (CD): 978-1-4673-7277-0
ISBN (Electronic): 978-1-4673-7278-7
DOI: 10.1109/BigDataCongress.2015.123
Regular:

Social media crises pose significant challenges for organizations in terms of their rapid rate of spread and potential persistent negative associations in terms of brand parameters and sustained... View More

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