IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compact multifunctional test structure to measure the in-plane thermoelectric figure of merit ZT of thin films

2015 Transducers - 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS)

Author(s): D. Moser ; D. Mueller ; O. Paul
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Anchorage, AK, USA
Conference Date: 21 June 2015
Page(s): 1,322 - 1,325
ISBN (Electronic): 978-1-4799-8955-3
ISSN (Electronic): 2164-1641
DOI: 10.1109/TRANSDUCERS.2015.7181175
Regular:

In response to recently renewed interest in thermoelectrics, this paper reports a novel compact, multifunctional test structure to measure the in-plane thermoelectric figure of merit ZT of thin... View More

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