IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optical fiber atomic force microscope with photonic crystal force sensor

2015 Transducers - 18th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS)

Author(s): A. Gellineau ; Y.-P Wong ; A. Wang ; M. J. Butte ; O. Solgaard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Anchorage, AK, USA
Conference Date: 21 June 2015
Page(s): 196 - 199
ISBN (Electronic): 978-1-4799-8955-3
ISSN (Electronic): 2164-1641
DOI: 10.1109/TRANSDUCERS.2015.7180895
Regular:

An atomic force microscope (AFM) integrated directly on the facet of a standard single-mode optical fiber is designed, fabricated, and tested. High resolution force sensing is achieved with a... View More

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