IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical analysis of multiple presentation attempts in iris recognition

2015 IEEE 2nd International Conference on Cybernetics (CYBCONF)

Author(s): Adam Czajka ; Kevin W. Bowyer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Gdynia, Poland
Conference Date: 24 June 2015
Page(s): 483 - 488
ISBN (CD): 978-1-4799-8320-9
ISBN (Electronic): 978-1-4799-8322-3
DOI: 10.1109/CYBConf.2015.7175982
Regular:

This paper presents experimental results showing uneven distributions of selected iris image quality metrics in the consecutive attempts in a biometric system that allows for multiple attempts to... View More

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