IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simplified and Improved Patch Ordering for Diabetes Mellitus detection

2015 IEEE 2nd International Conference on Cybernetics (CYBCONF)

Author(s): Ting Shu ; Bob Zhang ; Yuan Yan Tang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Gdynia, Poland
Conference Date: 24 June 2015
Page(s): 371 - 376
ISBN (CD): 978-1-4799-8320-9
ISBN (Electronic): 978-1-4799-8322-3
DOI: 10.1109/CYBConf.2015.7175962
Regular:

Recently, researchers have discovered that there are non-invasive ways to detect Diabetes Mellitus based on the analysis of human facial blocks. Even though a few algorithms have been developed to... View More

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