IEEE - Institute of Electrical and Electronics Engineers, Inc. - BONY: An algorithm to generate large synthetic combinational benchmark circuits

2015 19th International Symposium on VLSI Design and Test (VDAT)

Author(s): Priyankar Talukdar
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2015
Conference Location: Ahmedabad, India
Conference Date: 26 June 2015
Page(s): 1 - 2
ISBN (CD): 978-1-4799-1742-6
ISBN (Electronic): 978-1-4799-1743-3
DOI: 10.1109/ISVDAT.2015.7208094
Regular:

In this paper we address the problem of generating large combinational circuits with good fan in and fanout distribution, high Rent factor and large number of reconvergent gates. Such circuits are... View More

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